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Growth
of Thiobacillus ferrooxidans:
a Novel Experimental Design for Batch Growth and Bacterial Leaching
Studies
P.I.
Harvey and F.K. Crundwell
School of Process and Materials Engineering, University of the Witwatersrand,
Johannesburg, South Africa
Applied
and Environmental Microbiology,
Applied and Environmental Microbiology, July 1999, p 2586-2592
Vol. 63, No. 7
A short abstract . . .
The
concentrations of ferrous and ferric ions change dramatically during
the course of the batch experiments usually performed to study the
kinetics of the bacterial oxidation of ferrous ions and sulfide
minerals. This change in concentration of the iron species during
the course of the experiment often makes it difficult to interpret
the results of these experiments, as is evidenced by the lack of
consensus concerning the mechanism of bacterial leaching. If the
concentrations of ferrous and ferric ions were constant throughout
the course of the batch experiment, then the role of the bacteria
could be easily established, because the rate of the chemical leaching
should be the same at a given redox potential in the presence and
in the absence of bacteria.
In
this paper we report an experiment designed to obtain kinetic data
under these conditions. The redox potential is used as a measure
of the concentrations of ferrous and ferric ions, and the redox
potential of the leaching solution is controlled throughout the
experiment by electrolysis. The effects of ferrous, ferric, and
arsenite ions on the rate of growth of Thiobacillus ferrooxidans
on ferrous ions in this redox-controlled reactor are presented.
In addition, the growth of this bacterium on ferrous ions in batch
culture was also determined, and it is shown that the parameters
obtained from the batch culture and redox-controlled batch culture
are the same. An analysis of the results from the batch culture
indicates that the initial number of bacteria that are adapted to
the solution depends on the concentrations of ferrous and arsenite
ions.
Full article can be obtained at: http://aem.asm.org/cgi/reprint/63/7/2586
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